![]() ![]() Even though these problems are encountered in both the SEM and the TEM, the relative ease of imaging the very small inclusions in TEM confers a definite advantage to this technique. ![]() The main setbacks of using EDS for such a task more ยป are due to the presence of small phases of unknown thicknesses, non-homogeneity of the X-ray generation volumes, variation in absorption along the path length of the X-rays, etc. In the light of these results, we investigated the possibility of using a FEGSEM to characterize inclusions found in micro-alloyed steel welds used for arctic applications. Recent Monte Carlo simulations indicated that scanning electron electron microscopes (SEM`s) equipped with a field emission gun (FEG) might challenge transmission electron microscopes (TEM`s) for the characterization of small inclusions. These inclusions are generally too thick for EEL-spectrometry and require the use of EDS to characterize their chemical composition. ![]()
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